J Appl Phys 91:2742–2752Ĭhamard V, Pichat C, Dolino G (2001) Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction. J Appl Phys 85:7105–7111īuttard D, Bellet D, Dolino G, Baumbach T (2002) X-ray diffuse scattering of p-type porous silicon. J Appl Phys 83:5814–5822īuttard D, Dolino G, Faivre C, Halimaoui A, Comin F, Formoso V, Ortega L (1999) Porous silicon strain during in situ ultrahigh vacuum annealing. Thin Solid Films 276:69–71īuttard D, Bellet D, Dolino G, Baumbach T (1998) Thin layers and multilayers of porous silicon. J Appl Phys 79:8060–8070īuttard D, Bellet D, Baumbach T (1996b) X-ray diffraction investigation of porous silicon superlattices. Phys Rev B 79:125442īuttard D, Bellet D, Dolino G (1996a) X-ray diffraction investigation of the anodic oxidation of porous silicon. Solid State Commun 79:923–928īerwanger R, Henschel A, Knorr K, Huber P, Pelster R (2009) Phase transitions nd molecular dynamics of n-hexadecanol confined in silicon nanochannels. J Appl Phys 71:145–149īensaid A, Patrat G, Brunel M, de Bergevin F, Herino R (1991) Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction. Thin Solid Films 276:1–6īellet D, Dolino G, Ligeon M (1992) Studies of coherent and diffuse X-ray scattering by porous silicon. Phys Rev B 50:17162–17165īellet D, Dolino G (1996) Diffraction studies of porous silicon. J Cryst Growth 68:727–732īellet D, Dolino G (1994) X-ray observation of porous silicon wetting. Adv Drug Deliv Rev 60:1266–1277īarla K, Herino R, Bomchil G, Pfister JC, Freund A (1984) Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction. J Appl Phys 99:024304Īnglin EJ, Cheng L, Freeman WR, Sailor MJ (2008) Porous silicon in drug delivery devices and materials. This process is experimental and the keywords may be updated as the learning algorithm improves.Ībramof PG, Beloto AF, Ueta AY, Ferreira NG (2006) X-ray investigation of nanostructured stain-etched porous silicon. These keywords were added by machine and not by the authors. We also focus on selected key properties where XRD has been particularly informative: (a) strain, (b) the structural analysis of pSi multilayers, and (c) an analysis of pSi loaded with small molecules of fundamental or therapeutic interest. Such properties influence practical properties of pSi such as its biodegradability. Examples of the range of content in the analysis of pSi are provided, including formation mechanisms, layer thickness, extent of pSi oxidation, and degree of crystallinity. This review outlines key considerations in the use of diffraction techniques for analyses of this material in both thin film form and freestanding porous Si nano or microparticles. X-ray diffraction (XRD) is a useful, complementary tool in the structural characterization of porous silicon (pSi), providing information not readily available from direct visualization techniques such as electron microscopies.
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |